US PATENT SUBCLASS 117 / 201
.~ With means for measuring, testing, or sensing

Current as of: June, 1999
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117 /   HD   SINGLE-CRYSTAL, ORIENTED-CRYSTAL, AND EPITAXY GROWTH PROCESSES; NON-COATING APPARATUS THEREFOR

200  DF  APPARATUS {4}
201.~ With means for measuring, testing, or sensing {2}
202  DF  .~.~> With responsive control means
203  DF  .~.~> With a window or port for visual observation or examination

DEFINITION

Classification: 117/201

With means for measuring, testing, or sensing:

(under subclass 200) Subject matter which includes means for measuring, testing, or sensing a process condition or parameter during the process.

(1) Note. Since all processes and apparatus require controlling means in order to provide satisfactory operation, placement here requires more than merely a statement of controlling or operating at a certain set of conditions. Thus, not included are mere recitations of "means to control" absent a recitation of a means for measuring, sensing, or testing some parameter or condition. Further, merely reciting a program or cycle or time control is not sufficient for placement here.

(2) Note. Equivalent terms include examining, inspecting, observing, viewing, and monitoring.