US PATENT SUBCLASS 250 / 492.22
.~.~ Pattern control


Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use



250 /   HD   RADIANT ENERGY

492.1  DF  IRRADIATION OF OBJECTS OR MATERIAL {2}
492.2  DF  .~ Irradiation of semiconductor devices {4}
492.22.~.~ Pattern control


DEFINITION

Classification: 250/492.22

Pattern control:

(under subclass 492.2) Subject matter having means (e.g., template, program) representing information necessary to variably expose the semiconductor object or material and means or steps responsive to the representing means to irradiate or re-irradiate the object or material accordingly.

(1) Note. Systems or methods of this subclass type may include memory means, deflection coils, feedback loops, computer processing means, and object movement means.

(2) Note. Patterns of this subclass type may, for example, reduce the "proximity effect" on the semiconductor object or material.

SEE OR SEARCH THIS CLASS, SUBCLASS:

398, for deflecting or focussing charged particles onto the object.

491.1, for alignment of the irradiating beam and target.