US PATENT SUBCLASS 324 / 559
.~ Where a moving sensing electrode scans a stationary element under test
Current as of:
June, 1999
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324 /
HD
ELECTRICITY: MEASURING AND TESTING
557
DF
FOR INSULATION FAULT OF NONCIRCUIT ELEMENTS
{2}
559
.~ Where a moving sensing electrode scans a stationary element under test
DEFINITION
Classification: 324/559
Where a moving sensing electrode scans a stationary element under test:
(under subclass 557) Subject matter where a moving sensing electrode scans a stationary noncircuit element under test.
