US PATENT SUBCLASS 324 / 647
.~.~ Using a comparison or difference circuit


Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
629  DF  .~ Distributive type parameters {6}
647.~.~ Using a comparison or difference circuit {1}
648  DF  .~.~.~> With a bridge circuit


DEFINITION

Classification: 324/647

Using a comparison or difference circuit:

(under subclass 629) Subject matter wherein distributive type parameters are measured by correlating two or more electrical quantities.

SEE OR SEARCH THIS CLASS, SUBCLASS:

606, for signal evaluation or processing including comparison or difference techniques.

665, for measuring lumped type parameters by capacitive type measurements for water content including comparison or difference circuits.

672, for measuring lumped type parameters of an object or material including its dielectric characteristic by utilizing comparison or difference circuits.

679, for measuring lumped type parameters by capacitive type measurements with a comparison or difference circuit.

705, for measuring lumped type parameters by resistive or conductive type measurement including comparison or difference circuits. SEE OR SEARCH CLASS

327, Miscellaneous Active Electrical Nonlinear Devices, Circuits, and Systems,

1+, for comparison evaluation circuits.