US PATENT SUBCLASS 327 / 529
.~.~ Impact ionization

Current as of: June, 1999
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327 /   HD   MISCELLANEOUS ACTIVE ELECTRICAL NONLINEAR DEVICES, CIRCUITS, AND SYSTEMS

524  DF  SPECIFIC IDENTIFIABLE DEVICE, CIRCUIT, OR SYSTEM {22}
527  DF  .~ Superconductive (e.g., cryogenic, etc.) device {2}
529.~.~ Impact ionization

DEFINITION

Classification: 327/529

Impact ionization:

(under subclass 527) Subject matter wherein a breakdown can occur within a semiconductor device as a result of operation at temperatures approaching absolute zero (temperatures equal

to or lower than 30 K).

SEE OR SEARCH THIS CLASS, SUBCLASS:

186, for one or more stable state circuits including an impact ionization device.