US PATENT SUBCLASS 33 / 503
.~ Coordinate movable probe or machine


Current as of: June, 1999
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501  DF  GAUGE {61}
503.~ Coordinate movable probe or machine


DEFINITION

Classification: 33/503

Coordinate movable probe or machine:

(under subclass 501) Subject matter wherein the contact member is (a) part of a device to determine a position or change in position in at least two perpendicular direction with respect to a common origin or (b) movable in at least two perpendicular direction with respect to a common origin.

SEE OR SEARCH THIS CLASS, SUBCLASS:

1, for a two-coordinate motion device.

18+, for a scriber controlled by coordinate motion probe support.

505, for a gauge having a computer control or an analogue-to-digital device.

520, for a center locator or center line location.

551+, for a profile test with a support for tested article. 556, for a profile gauge having a movable contact probe.

558, for a movable contact probe which has movement in a least two perpendicular direction where no linear movement in the perpendicular directions is involve.

568, for a work support adjustment in at least two perpendicular directions.