US PATENT SUBCLASS 33 / 544.4
.~.~ Tapered probe

Current as of: June, 1999
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33 /   HD   GEOMETRICAL INSTRUMENTS

501  DF  GAUGE {61}
542  DF  .~ Internal {6}
544.4.~.~ Tapered probe

DEFINITION

Classification: 33/544.4

Tapered probe:

(under subclass 542) Subject matter wherein the contact member has a contact surface which is symmetrical about an axis and decreases gradually in size in a dimension perpendicular to the axis.