US PATENT SUBCLASS 356 / 346
.~ Spectroscopy


Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

345  DF  BY LIGHT INTERFERENCE (E.G., INTERFEROMETERS) {11}
346.~ Spectroscopy


DEFINITION

Classification: 356/346

Spectroscopy:

(under subclass 345) Subject matter wherein the interference phenomenon is used to analyze the spectral characteristics of light.

(1) Note. See Search Notes under subclasses 300+ above.

SEE OR SEARCH THIS CLASS, SUBCLASS:

300+, for dispersed light spectroscopic measuring and testing.

402+, for filter photometers which analyze the wavelength and intensity of emitted or absorbed light by materials as a result of reflective or transmissive tests, where filters rather than dispersive mediums are used to isolate wavelengths of light.