US PATENT SUBCLASS 356 / 928
INVESTIGATING OR ANALYZING MATERIALS BY THE USE OF OPTICAL MEANS, I.E., USING INFRA-RED, VISIBLE, OR ULTRA-VIOLET LIGHT (GO1N 21/00)


Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use



356 /   HD   OPTICS: MEASURING AND TESTING

928INVESTIGATING OR ANALYZING MATERIALS BY THE USE OF OPTICAL MEANS, I.E., USING INFRA-RED, VISIBLE, OR ULTRA-VIOLET LIGHT (GO1N 21/00) {5}
929  DD  .~> Arrangements, or apparatus for facilitating the optical investigation (GO1N 21/01) {1}
931  DD  .~> Systems in which incident light is modified in accordance with the properties of material investigated (GO1N 21/17) {8}
948  DD  .~> Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light (GO1N 21/62) {1}
953  DD  .~> Probe photometers (GO1N 21/85B)
954  DD  .~> Scan or image signal processing arrangements specially adapted for investigating the presence of flaws or contaminates, e.g., for scan signal adjustments, for detecting different kinds of defects, for compensating for structures (GO1N 21/88)