US PATENT SUBCLASS 374 / 128
.~.~.~ Having significant signal handling circuitry (e.g., linearizing, emissivity compensation)

Current as of: June, 1999
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374 /   HD   THERMAL MEASURING AND TESTING

100  DF  TEMPERATURE MEASUREMENT (E.G., THERMOMETER) {13}
120  DF  .~ In spaced noncontact relationship to specimen {3}
121  DF  .~.~ By thermally emitted radiation {11}
128.~.~.~ Having significant signal handling circuitry (e.g., linearizing, emissivity compensation)

DEFINITION

Classification: 374/128

Having significant signal handling circuitry (e.g., linearizing, emissivity compensation):

(under subclass 121) Subject matter having details of a circuit which processes the sensed signal.

(1) Note. Included herein is processing to obtain a signal linearly related to the temperature or compensating for the emissivity characteristics of the radiating object.