US PATENT SUBCLASS 378 / 44
.~ Fluorescence


Current as of: June, 1999
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378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
44.~ Fluorescence {2}
45  DF  .~.~> Composition analysis {4}
50  DF  .~.~> Thickness or density analysis


DEFINITION

Classification: 378/44

Fluorescence:

(under subclass 1) Subject matter including the measurement or analysis of secondary X-rays resulting from the excitation by primary x-radiation or gamma radiation of analyte atoms.

(1) Note. Although not specifically include within each of the following definitions, fluorescence systems usually

include (a) a source of primary X-rays or gamma rays, (b) an analyte which emits fluorescent X-rays, (c) an analyte holder or positioning means, and (d) a detector of the fluorescent X-rays.

SEE OR SEARCH THIS CLASS, SUBCLASS:

3, for Mossbauer effect devices.

6, for fluorescence or scatter mapping.

143, for sources which produce secondary X-rays.

SEE OR SEARCH CLASS 209, Classifying, Separating, and Assorting Solids, appropriate subclasses, especially

589, for radiant energy type automatic assorting.

250, Radiant Energy,

306+, for sample bombardment with protons or electrons which may produce X-rays and subclasses 253+ for geological surveying.

376, Induced Nuclear Reactions: Processes, Systems, and Elements,

156+, for X-rays generated by means of an induced nuclear reaction, e.g., wherein the internal conversion of an electron within the nucleus generates soft gamma rays.