US PATENT SUBCLASS 378 / 79
.~.~.~ Analyte support


Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use



378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
70  DF  .~ Diffraction, reflection, or scattering analysis {3}
71  DF  .~.~ Diffractometry {3}
79.~.~.~ Analyte support {2}
80  DF  .~.~.~.~> With environmental control
81  DF  .~.~.~.~> Goniometer


DEFINITION

Classification: 378/79

Analyte support:

(under subclass 71) Subject matter including detailed structure of the analyte holder or positioning means.