US PATENT SUBCLASS 378 / 86
.~.~ Scatter analysis

Current as of: June, 1999
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378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
70  DF  .~ Diffraction, reflection, or scattering analysis {3}
86.~.~ Scatter analysis {3}
87  DF  .~.~.~> Imaging
88  DF  .~.~.~> Composition analysis
89  DF  .~.~.~> Thickness or density analysis {1}

DEFINITION

Classification: 378/86

Scatter analysis:

(under subclass 70) Subject matter including the measurement

or analysis of X-rays that have been modulated in direction by an object under examination.

SEE OR SEARCH THIS CLASS, SUBCLASS:

7, for scatter compensation in computerized tomography.