US PATENT SUBCLASS 382 / 225
.~.~ Cluster analysis
Current as of: June, 1999
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DEFINITION
Classification: 382/225
Cluster analysis:
(under subclass 224) Subject matter wherein pattern*s are classified according to clusters or groups of points or vectors indicative of features in a multidimensional feature space.
(1) Note. While "feature extraction" is a process of mapping image points into vectors in a multidimensional feature space, the process of detecting clusters of vectors in that space and separating the clusters is a task of "classification".
