US PATENT SUBCLASS 439 / 169
.~ Test probe


Current as of: June, 1999
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439 /   HD   ELECTRICAL CONNECTORS

166  DF  CONVERTIBLE BY INTERNAL CHANGE TO SELECTIVELY COOPERATE WITH A DIFFERENT CONTACT {5}
169.~ Test probe


DEFINITION

Classification: 439/169

Test probe:

(under subclass 166) Electrical connector comprising a generally rodlike member having an elongated portion adapted to be grasped by the hand of an operative for random manipulation thereof and having a contact* extending from the axial extremity thereof.

(1) Note. The contact may comprise a coupling part* for interfitting with a particular mating part*.

SEE OR SEARCH THIS CLASS, SUBCLASS:

219, for an alternatively connected test probe.

482, for a randomly manipulated test probe including a handle or distinct manipulating means.