US PATENT SUBCLASS 700 / 110
.~.~.~.~ Defect analysis or recognition


Current as of: June, 1999
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700 /   HD   DATA PROCESSING: GENERIC CONTROL SYSTEMS OR SPECIFIC APPLICATIONS

90  DD  SPECIFIC APPLICATION, APPARATUS OR PROCESS {16}
95  DD  .~ Product assembly or manufacturing {7}
108  DD  .~.~ Performance monitoring {2}
109  DD  .~.~.~ Quality control {1}
110.~.~.~.~ Defect analysis or recognition