US PATENT SUBCLASS 702 / 185
.~.~.~ Cause or fault identification

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

127  DF  MEASUREMENT SYSTEM {15}
182  DF  .~ Performance or efficiency evaluation {2}
183  DF  .~.~ Diagnostic analysis {2}
185.~.~.~ Cause or fault identification

DEFINITION

Classification: 702/185

Cause or fault identification:

Subject matter under 183 including means to determine a possible source or a specific fault statement of the abnormal operation condition or fault.

(1) Note. The specific fault statement includes, for example, conditional conclusion, nature or location,

comparative result, or state of fault.