US PATENT SUBCLASS 702 / 26
.~.~.~ By particle count


Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
22  DF  .~ Chemical analysis {6}
23  DF  .~.~ Quantitative determination (e.g., mass, concentration, density) {3}
26.~.~.~ By particle count


DEFINITION

Classification: 702/26

By particle count:

(under subclass 23) Subject matter wherein the amount or proportion of the component is determined by totalizing quantity of particles in the component.

SEE OR SEARCH CLASS

377, Electrical Pulse Counters, Pulse Dividers, or Shift Registers: Circuits And Systems,

1+, for application, particularly subclasses 10+ for field of

view contains plural entities or entities scanned plural times, and subclasses 19+ for measuring or testing.