US PATENT SUBCLASS 702 / 77
.~.~.~.~.~ Using Fourier method

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
57  DF  .~ Electrical signal parameter measurement system {6}
66  DF  .~.~ Waveform analysis {5}
75  DF  .~.~.~ Frequency {2}
76  DF  .~.~.~.~ Frequency spectrum {1}
77.~.~.~.~.~ Using Fourier method

DEFINITION

Classification: 702/77

Using Fourier method:

(under subclass 76) Subject matter wherein the frequency spectrum is analyzed or determined using Fourier analysis or Fourier transform technique.

SEE OR SEARCH CLASS

324, Electricity: Measuring and Testing,

76.21, for frequency spectrum analysis by Fourier analysis.