US PATENT SUBCLASS 702 / FOR 164
.~.~ Filtering (364/572)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 155  DF  .~ Operations performed (364/570) {11}
FOR 164.~.~ Filtering (364/572)

DEFINITION

Classification: 702/FOR.164

Filtering:

Foreign art collections wherein the operation performed is the selection or removal of signal or data components in accordance with specified criteria.