US PATENT SUBCLASS 702 / FOR 168
.~.~ Fourier analysis (364/576)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 155  DF  .~ Operations performed (364/570) {11}
FOR 168.~.~ Fourier analysis (364/576)

DEFINITION

Classification: 702/FOR.168

Fourier analysis:

Foreign art collections wherein there is a transformation of data between the time domain or space domain and the frequency domain.