US PATENT SUBCLASS 714 / 735
.~ Device response compared to input pattern

Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

724  DF  DIGITAL LOGIC TESTING {10}
735.~ Device response compared to input pattern

DEFINITION

Classification: 714/735

Device response compared to input pattern:

(under subclass 724) Subject matter in which the operational condition of a system or device is determined by comparing the system or device response to a test signal input pattern.