US PATENT SUBCLASS 73 / 31.06
.~.~ Semiconductor

Current as of: June, 1999
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73 /   HD   MEASURING AND TESTING

23.2  DF  GAS ANALYSIS {15}
31.05  DF  .~ Detector detail {1}
31.06.~.~ Semiconductor

DEFINITION

Classification: 73/31.06

Semiconductor:

(under subclass 31.05) Subject matter wherein the detector includes semiconductor material.