US PATENT SUBCLASS 73 / 602
.~.~.~ With signal analyzing or mathematical processing


Current as of: June, 1999
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73 /   HD   MEASURING AND TESTING

570  DF  VIBRATION {10}
584  DF  .~ By mechanical waves {13}
596  DF  .~.~ Beamed {10}
602.~.~.~ With signal analyzing or mathematical processing


DEFINITION

Classification: 73/602

With signal analyzing or mathematical processing:

(under subclass 596) Subject matter wherein electrical or electronic means are provided for spectrum analysis or to mathematically process electrical signals corresponding to the sonic waves, to determine flaw size, shape, orientation, to improve resolution, etc.

(1) Note. This subclass is not intended to include subject matter under subclass 596 wherein simple mathematical operations are performed, such as combining of signals, comparing signals, doubling signals, forming a ratio, etc. This subclass includes oscilloscope frequency versus amplitude display, Fourier transformation of the signal for spectrum analysis, mathematical convolution involving the Laplace transformation of the signal for signal compression, filtering for spectrum analysis, etc.

(2) Note. This subclass will include only mathematical processing or calculating if combined with significant measuring or testing of the type provided in subclasses 596+. Nominal measuring or testing combined with significant data processing or calculating computers is in Class 364.

SEE OR SEARCH CLASS

364, Electrical Computers and Data Processing Systems,

506, for measuring or testing, subclass 507, for flaw or defect, subclass 508, for stress, strain, or vibration, subclass 550 for measuring, testing, or monitoring.