US PATENT SUBCLASS 73 / 655
.~.~ With light beam indicator


Current as of: June, 1999
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73 /   HD   MEASURING AND TESTING

570  DF  VIBRATION {10}
649  DF  .~ Sensing apparatus {5}
655.~.~ With light beam indicator {2}
656  DF  .~.~.~> By optical holography
657  DF  .~.~.~> By frequency or phase shift


DEFINITION

Classification: 73/655

With light beam indicator:

(under subclass 649) Subject matter wherein a light beam is employed which is modified in accordance with the vibrations in order to obtain an indication or measurement.

(1) Note. Measurement of a modification in the direction or intensity of the light beam is included in this subclass.

SEE OR SEARCH THIS CLASS, SUBCLASS:

653, for similar structure in combination with inertia type sensing apparatus.

SEE OR SEARCH CLASS

356, Optics: Measuring and Testing,

445+, for optical measuring and testing involving interferometry.