US PATENT SUBCLASS 73 / 767
.~.~ Plural sensors at single location (e.g., diverse orientation, plural level)

Current as of: June, 1999
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73 /   HD   MEASURING AND TESTING

760  DF  SPECIMEN STRESS OR STRAIN, OR TESTING BY STRESS OR STRAIN APPLICATION {12}
763  DF  .~ Specified electrical sensor or system {6}
767.~.~ Plural sensors at single location (e.g., diverse orientation, plural level)

DEFINITION

Classification: 73/767

Plural sensors at single location (e.g., diverse orientation, plural level):

(under subclass 763) Subject matter having a plurality of strain gages at substantially a single location on the specimen to provide a different response to distinct strain levels or types (e.g., bending, compression).

(1) Note. The term "substantially" is intended to include sensors spaced from each other at distances small compared to the specimen dimensions.

SEE OR SEARCH THIS CLASS, SUBCLASS:

771, for a system having selector switch means for sensors at different locations.

781, for a load or strain transmitting element for an electrical sensor which is differently responsive to different load or strain orientations.