US PATENT SUBCLASS 257 / 418
.~.~.~ With means to concentrate stress


Current as of: June, 1999
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257 /   HD   ACTIVE SOLID-STATE DEVICES (E.G., TRANSISTORS, SOLID-STATE DIODES)

414  DF  RESPONSIVE TO NON-ELECTRICAL SIGNAL (E.G., CHEMICAL, STRESS, LIGHT, OR MAGNETIC FIELD SENSORS) {4}
415  DF  .~ Physical deformation {3}
417  DF  .~.~ Strain sensors {1}
418.~.~.~ With means to concentrate stress {1}
419  DF  .~.~.~.~> With thinned central active portion of semiconductor surrounded by thick insensitive portion (e.g., diaphragm type strain gauge)


DEFINITION

Classification: 257/418

With means to concentrate stress:

(under subclass 417) Subject matter wherein the active

solid-state device has means to concentrate the physically deforming stress.